p35-39 EAS IC Awards 2008 FMT 1/7/08 16:51 Page 35
IC INDUSTRY AWARDS PREVIEW 35
FMT FINAL MANUFACTURING
BEST TOOL AWARD
FMT FINAL MANUFACTURING TECHNOLOGY
Final manufacturing technology, including test, assembly and packaging, has come a long way from being the
back end of the microelectronics industry. With smaller devices and a blurring of the line between device and
packaging, this area has become as complex and important as every aspect of manufacturing.
BEST TOOL AWARD
The best tool in advancing final manufacturing needs for the semiconductor industry.
BEST PROCESS AWARD
This Award recognises the company or individual who have developed processes that have enabled fMT
solutions to industry challenges.
program modifications. This reduces test with 20 GHz bandwidth is also available
times and saves you money. to enable the test of up to 5 RF test
● Virtual Multiple Testhead Technology structures in a single touchdown.
offers dramatic throughput improvements ● Uniform hardware platform protects
AGILENT TECHNOLOGIES
All 4080 Series testers running SPECS investment
www.agilent.com
support both synchronous and All members of the 4080 Series share the
asynchronous parallel test using Agilent's same hardware, and it is easy to upgrade
The 4080 series of Parametric Test
Virtual Multiple Testhead Technology. from one model to another. This protects
Systems
Using this technique in conjunction with your investment and insures that your
the appropriate test element group (TEG) equipment does not become obsolete.
The 4080 series of parametric test
design, it is possible to get throughput ● Conformance to SEMI standards
systems. This new family of test systems is
improvements of up to 50% over facilitates test automation SPECS-FA,
a superset of the previous 4070 series of
conventional serial techniques. the factory automation version of
test systems which combines the proven
● Flexible configuration minimises costs Agilent's SPECS test shell, runs on all
accuracy and reliability of the previous
4080 Series testers are available in two models of the 4080 Series tester family.
generation with significantly higher
versions: standard low current and ultra SPECS-FA fully supports SEMI
throughput. The 4080 is already well
low current, allowing you to select the automation standards E5 (SECS II), E30
proven in several major semiconductor
most cost effective configuration for each (GEM), E87 (CMS), E39 (OSS), E40
companies where it is in manufacturing
4080 Series tester that you purchase. (PMS), E90 (STS), and E94 (CJM).
use on a 24 / 7 basis.
● High speed capacitance measurement ● Linux OS improves supportability and
Existing and new wafer fabs running
reduces test times 4080 Series testers all lowers costs
advanced processes face ever greater
support an optional high speed
parametric testing challenges. Out of
capacitance measurement unit (HS-CMU) The Agilent 4080 Series system software
necessity, parametric test has expanded
that is integrated into the test head and Agilent SPECS and SPECS-FA test
beyond pure DC measurement and
electronics. shells use the Linux operating system.
now spans a variety of different
● HV-SPGU supports testing of next- This saves money through the use of
measurement types, including parallel
generation Flash memory cell processes cheaper and more maintainable Linux
test, Flash cell write/erase testing, and
The 4082F and 4083A both support a based system hardware.
RF S parameter characterisation.
Semiconductor Pulse Generator Unit This system allows customers to
Anticipating needs, Agilent has developed
(SPGU) mainframe and high voltage seamlessly move from older platform to
the versatile and flexible 4080 parametric
SPGU (HV-SPGU) modules that permit the newer platform whilst retaining
test platform.
testing of advanced Flash memory cell existing test code resulting in hassle free
technologies. deployment.
● Next generation test platform boosts
performance with ultra-fast CPU
● RF S parameter measurement and System has new features which allows on
The newly designed 4080 platform
optional RF matrix permit efficient wafer S parameter measurements through
incorporates a more powerful CPU and
testing of RF structures in production an RF switching matrix plus the ability to
other architecture improvements that
The 4083A supports an Agilent PNA for test NVM structures at up to +/- 40V via
boost the throughput of transferred 4070
20 GHz S parameter measurements. the SPGU with arbitrary waveform
plans by 10 to 20 percent without any
In addition, an 8x10 RF matrix option generator.
July 2008
www.euroasiasemiconductor.com
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