p27-34 EAS IC Awards 2008 yield management 2/7/08 09:56 Page 27
IC INDUSTRY AWARDS PREVIEW 27
YIELD MANAGEMENT BEST TOOL AWARD
YIELD MANAGEMENT
Semiconductor manufacturing requires such rigid parameters that every minor improvement to the process
can mean the difference between success and failure. Yield management has moved on from simple metrology
and consulting to become a critical component of success in such a demanding manufacturing environment.
YIELD MANAGEMENT BEST TOOL AWARD
This Award recognises excellence for tools that improve yield management in semiconductor manufacturing.
YIELD MANAGEMENT BEST PROCESS
Yield management is more than just measurement and this Award is presented for any idea that has resulted
in an improvement in yield management.
manufacturers, bumping service reliability delivers to customers the
providers, packaging foundries and test optimal capital investment in inspection
houses monitor their production processes equipment.
and enhance yield.
CAMTEK INTELLIGENT IMAGING
The Falcon systems measure and Responsiveness:
LTD.
detect surface defects, as well as probe The software based, modular architecture
www.camtek.co.il mark damage to bond pads. They measure of Falcon's systems enables addressing
deviations in solder and gold bump height, unique customer requirements with a high
Falcon line of automated wafer
shape, size and placement. The systems degree of customisation, as well as
inspection & metrology systems
inspect at pre test, post test, and post providing an easy and cost effective field
dicing stages to check that dice are free upgrade package for existing equipment.
Camtek designs, develops, manufactures
of mechanical damage or contamination
and that bond pads and flip-chip bumps Support:
and markets technologically advanced,
can support a reliable interconnect. Camtek appreciates the value of strong
cost effective systems and related
Camtek's modular, software-based field support at close proximity to the
software products that are used to
architecture ensures flexible adaptation to customer manufacturing plant. Therefore
enhance processes and yields. Camtek
each of our customer's individual needs. Camtek has established customer support
provides intelligent, automated optical
Integrating 2D and 3D metrology and infrastructure. Organised in eight
inspection systems (AOI) to the inspection systems on the same platform subsidiaries in the US, Europe, Japan,
Semiconductor Manufacturing and
enables the Falcon to analyse bump China, Hong Kong, Taiwan, Korea and
Packaging, IC Substrates, and Printed
coplanarity or report statistical data for Singapore, Camtek provides local service,
Circuit Board (PCB) industries. The
process monitoring. spare parts, training, demo and sales
company addresses the specific needs of
An online statistical process control services to its customers wherever they
each industry with dedicated solutions,
(SPC) package outputs relevant charts to are located.
assist quality assurance engineers identify
based on a common core of intelligent
root causes of defects, thus reducing
imaging technologies.
process variations and enhancing
production yields.
The Falcon Family Falcon's high productivity results from
Advanced packaging of semiconductor its advanced electro optics and massive
devices depends on ‘known good die’ to computing power while its superb
ensure high production yields and reliable detection ability comes from its expansive
CARL ZEISS SMT - SMS
device performance. Defects in the active set of sophisticated detection engines.
DIVISION
die area or on interconnect pads, as well www.smt.zeiss.com/sms
as deviations in bump dimensions and Performance:
placement, may lead to device failure. The Falcon family offers modular and
MeRiT MG 45
Built upon over 20 years of experience software intensive architecture, which
in developing automated optical enables flexible adaptation to customer-
Carl Zeiss has developed a unique mask
inspection (AOI) systems, the Falcon specific road maps and high versatility for
repair system based on electron beam
family addresses wafer level inspection standard and non standard applications.
needs at production rates. The systems This combination of performance and
technology called MeRiT MG 45. This
help semiconductor and MEMS flexibility with ease of operation and
system overcomes the physical limits of
July 2008 www.euroasiasemiconductor.com
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