PRODUCT GUIDE
43
Company Booth Company Booth
Umicore Thin Film Products 252 Nikko Metals Europe GmbH 760
Solvay Solexis 570
Process Chamber Components; Graphite; Carbon Fiber Carbon
(CFC); Pyrolytic Boron Nitride (PBN) Silicon on Insulator (SOI); Silicon on Sapphire (SOS); Silicon
CoorsTek Ltd. 440 Carbide;
Covalent Materials Corporation 516 Covalent Materials Corporation 516
Heraeus 1134 Logitech Ltd. 1221
Kurt J. Lesker Company 731 Nanotec International GmbH 1045
Multi-Lab Ltd. 440 SOITEC 552
OXIDKERAMIK J. Cardenas GmbH 502 SPS-Europe B.V. 656
Scottish Semiconductor Supplier Forum 440
SPM AG 468 Solar Cell Substrates; Crystalline Silicon (c-Si); Thin Film
SSE Semiconductor Services Europe B.V. 228 Fraunhofer IISB 932
TELTEC Semiconductor Technic GmbH 827 SEMCO Engineering 1525
Umicore Thin Film Products 252
Strained silicon; Engineered Substrates
Quartz Ware (Silicon Carbide, Fused Quartz Glass, Sapphire), IQE plc 164
Ceramic & Oxide Ceramic Fixtures SOITEC 552
AGC Asahi Glass Company 1227
AHF Analysentechnik AG 245 Test; Monitor Wafers; Reclaim or Virgin
Ascen'tec Europe B.V. 967 MacroSolutions Europe GmbH 304
CoorsTek Ltd. 440 Sonoscan, Inc. 905,710
Covalent Materials Corporation 516
Ferrotec GmbH 761 Thin & Thick film substrates for MEMS
Heraeus 1134 SOITEC 552
Innodys 816
Metronics Semiconductor Equipment GmbH 221
MATERIALS, TEST
Multi-Lab Ltd. 440
OXIDKERAMIK J. Cardenas GmbH 502 Burn In Boards; Performance Boards (incl. Low; High Temp
QC-Quality Control GmbH 944 and Ceramic)
Quarld Ltd. -Quartz World 1436 CoreTest Technologies 1573
Scottish Semiconductor Supplier Forum 440 MacroSolutions Europe GmbH 304
Silitec 1440 Microtest 1563
SPM AG 468 Nanotec International GmbH 1045
TELTEC Semiconductor Technic GmbH 827 Quasys AG 940
RTI (Robson Technologies, Inc.) 710
MATERIALS, SUBSTRATE
Probe Cards; DUT boards and other probing accessories (incl
Compound Semiconductor Substrates (GaAs on Silicon; GaN; Ceramic and Special Purpose Probe Cards)
InP; SiGe, etc.) Cascade Microtech 858
Covalent Materials Corporation 516 CoreTest Technologies 1573
Fraunhofer IISB 932 Feinmetall GmbH 868
GTI Technologies, Inc. 865 HTT, High Tech Trade GmbH 966
Logitech Ltd. 1221 Leeno Industrial Inc. 1153
Nikko Metals Europe GmbH 760 Left Coast Instruments 920
SOITEC 552 Microtest 1563
Sonoscan, Inc. 710,905 Nanotec International GmbH 1045
SPS-Europe B.V. 656 NHK Spring Co., Ltd. 1464
Suss MicroTec AG 604
Epitaxial; Epi; Gettered; Internal Gettered Wafers TestPro Pte Ltd 1464
Covalent Materials Corporation 516
IQE plc 164 Structural Circuits; Test; Thermal Fixturing
Logitech Ltd. 1221 CoreTest Technologies 1573
Nikko Metals Europe GmbH 760 Microtest 1563
Gallium Arsenide (GaAs); Sapphire Substrates Test Sockets; Contactors and Contact Accessories
Fraunhofer IISB 932 Cascade Microtech 858
Logitech Ltd. 1221 CoreTest Technologies 1573
SOITEC 552 Feinmetall GmbH 868
SPS-Europe B.V. 656 HTT, High Tech Trade GmbH 966
Leeno Industrial Inc. 1153
Prime; Polished; Mirrored Wafers MacroSolutions Europe GmbH 304
Covalent Materials Corporation 516 Multitest Elektronische Systeme GmbH 1140
Mid-September 2008
www.euroasiasemiconductor.com
Page 1 |
Page 2 |
Page 3 |
Page 4 |
Page 5 |
Page 6 |
Page 7 |
Page 8 |
Page 9 |
Page 10 |
Page 11 |
Page 12 |
Page 13 |
Page 14 |
Page 15 |
Page 16 |
Page 17 |
Page 18 |
Page 19 |
Page 20 |
Page 21 |
Page 22 |
Page 23 |
Page 24 |
Page 25 |
Page 26 |
Page 27 |
Page 28 |
Page 29 |
Page 30 |
Page 31 |
Page 32 |
Page 33 |
Page 34 |
Page 35 |
Page 36 |
Page 37 |
Page 38 |
Page 39 |
Page 40 |
Page 41 |
Page 42 |
Page 43 |
Page 44 |
Page 45 |
Page 46 |
Page 47 |
Page 48 |
Page 49 |
Page 50 |
Page 51 |
Page 52 |
Page 53 |
Page 54 |
Page 55 |
Page 56 |
Page 57 |
Page 58 |
Page 59 |
Page 60 |
Page 61 |
Page 62 |
Page 63 |
Page 64 |
Page 65 |
Page 66 |
Page 67 |
Page 68 |
Page 69 |
Page 70 |
Page 71 |
Page 72 |
Page 73 |
Page 74 |
Page 75 |
Page 76