32
PRODUCT GUIDE
Company Booth Company Booth
Package Inspection; Lead Scanners EURIS GmbH 452
EV Group E. Thallner GmbH 1304 Frontier Semiconductor 1132
HTT, High Tech Trade GmbH 966 FRT, Fries Research & Technology GmbH 145
MacroSolutions Europe GmbH 304 John P. Kummer GmbH 710
MueTec GMBH 960 KITEC microelectronic technologie GmbH 109
PVA TePla AG,Division Plasma Systems 826 KLA-Tencor Corporation 704
Sonoscan, Inc. 905,710 LayTec GmbH 1505
View Micro-Metrology 109 MueTec GMBH 960
PANalytical 144
Particle Monitors; Analysers - Airborne or Liquid PSI Standards 920
Capovani Brothers Inc. 414 PVA TePla AG,Division Plasma Systems 826
Fraunhofer IISB 932 Semilab Co., Ltd. 128
Hach Ultra Analytics GmbH 236 Sentech Instruments GmbH 402
Hager+Elsasser GmbH 1508 Veonis Technologies GmbH 920
Omnisens SA 944
QC-Quality Control GmbH 944 Thermal Sensing, Measurement, Analysis
Raytex Corporation 537 BASF SE 912
Rion Co., Ltd. 625 Frontier Semiconductor 1132
TELTEC Semiconductor Technic GmbH 827 Hans E. Winkelmann GmbH 1360
HORST GmbH 105
Plate Inspection Equipment LayTec GmbH 1505
KoCos Automation GmbH 472 Polytec GmbH 720
MueTec GMBH 960 Veonis Technologies GmbH 920
Resistivity Measurement; 4 Point Probe; Sheet resistance Wafer; Substrate Metrology; Topology; Nanotopography;
Dynamic Solutions International 816 Flatness Measurement; Crystalline Orientation
E+H Metrology GmbH 710 Advantools Co., Ltd. 645
EURIS GmbH 452 Capovani Brothers Inc. 414
Fraunhofer IISB 932 CyberTechnologies GmbH 1147
Frontier Semiconductor 1132 E+H Metrology GmbH 710
John P. Kummer GmbH 710 EURIS GmbH 452
KITEC microelectronic technologie GmbH 109 Fraunhofer IISB 932
KLA-Tencor Corporation 704 Fraunhofer IPA 1330
Polytec GmbH 720 Frontier Semiconductor 1132
Raytex Corporation 537 FRT, Fries Research & Technology GmbH 145
Scottish Semiconductor Supplier Forum 440 John P. Kummer GmbH 710
Semi Scenic UK Ltd. 440 JTA Ltd. 869
Semilab Co., Ltd. 128 KLA-Tencor Corporation 704
Sentech Instruments GmbH 402 LayTec GmbH 1505
TECHLINK 853 MacroSolutions Europe GmbH 304
Tec-Sem AG 1152 Meyer Burger AG 1326
TELTEC Semiconductor Technic GmbH 827 MueTec GMBH 960
Veonis Technologies GmbH 920 PANalytical 144
Quasys AG 940
Spectrometers; Fourier Transform Infrared (FTIR); Attenuated Raytex Corporation 537
Total Reflectance FTIR (ATR-FTIR); Rigaku Corporation 514
Advanced Metrology Systems LLC. 920 SAM TEC GmbH 826
Dynamic Solutions International 816 Semilab Co., Ltd. 128
Fraunhofer IISB 932 Technos Europe Limited 471
FRT, Fries Research & Technology GmbH 145 Tec-Sem AG 1152
INFICON AG 926 Viscom AG 956
JEOL (Germany) GmbH 741 Vistec Semiconductor Systems GmbH 214
John P. Kummer GmbH 710
KLA-Tencor Corporation 704 Weight Measurement; Precision Scales
Polytec GmbH 720 Ascen'tec Europe B.V. 967
SAES Getters SpA 1121 Capovani Brothers Inc. 414
TELTEC Semiconductor Technic GmbH 827 HTT, High Tech Trade GmbH 966
Veonis Technologies GmbH 920
Wire Bonding Inspection; Test
Stress; Refractive Index; Reflectivity & Conductivity Capovani Brothers Inc. 414
Measurement CyberTechnologies GmbH 1147
Ascen'tec Europe B.V. 967 Dage Semiconductor GmbH 420
E+H Metrology GmbH 710 EV Group E. Thallner GmbH 1304
www.euroasiasemiconductor.com Mid-September 2008
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