10
IC INDUSTRY AWARDS WINNER 2008
Award: FMT Final Manufacturing - Best Tool
Company: Agilent Technologies
Tool: The 4080 series of Parametric Test Systems
Website: www.agilent.com
The 4080 series of Parametric
Test Systems
T
his new family of test asynchronous parallel test using Agilent's with 20 GHz bandwidth is also available
systems is a superset of the Virtual Multiple Testhead Technology. to enable the test of up to 5 RF test
previous 4070 series of test Using this technique in conjunction with structures in a single touchdown.
systems which combines the proven the appropriate test element group (TEG)
accuracy and reliability of the previous design, it is possible to get throughput Uniform hardware platform
generation with significantly higher improvements of up to 50% over protects your investment
throughput. The 4080 is already well conventional serial techniques. All members of the 4080 Series share the
proven in several major semiconductor same hardware making it easy to upgrade
companies where it is in manufacturing Flexible configuration minimizes costs. from one model to another. This protects
use on a 24 * 7 basis. 4080 Series testers are available in two your investment and insures that your
versions: standard low-current and ultra- equipment does not become obsolete.
Existing and new wafer fabs running low current, allowing you to select the
advanced processes face ever-greater most cost-effective configuration for each Conformance to SEMI
parametric testing challenges. Out of 4080 Series tester that you purchase. standards facilitates test
necessity parametric test has expanded automation
beyond pure DC measurement and now High-speed capacitance measurement SPECS-FA, the factory automation
spans a variety of different measurement reduces test times. 4080 Series testers all version of Agilent's SPECS test shell,
types. These include: parallel test, Flash support an optional high-speed runs on all models of the 4080 Series
memory cell read/write/erase testing and capacitance measurement unit (HS-CMU) tester family. SPECS-FA fully supports
RF S-parameter characterization. that is integrated into the test head SEMI automation standards E5 (SECS
Anticipating these needs, Agilent electronics. II), E30 (GEM), E87 (CMS), E39 (OSS),
Technologies has developed the versatile E40 (PMS), E90 (STS), and E94 (CJM).
and flexible 4080 parametric test HV-SPGU supports testing
platform. of next-generation Flash Linux OS improves
memory cell processes supportability and lowers
Next generation test The 4082F and 4083A both support a costs
platform boosts Semiconductor Pulse Generator Unit The Agilent 4080 Series system software
performance with (SPGU) mainframe and high-voltage and Agilent SPECS and SPECS-FA test
ultra-fast CPU SPGU (HV-SPGU) modules that permit shells use the Linux operating system.
The newly-designed 4080 platform testing of advanced non volatile memory This saves money through the use of
incorporates a more powerful CPU and structures at +/- 40V via the SPGU cheaper and more maintainable Linux-
other architecture improvements that arbitrary waveform generator. based system hardware. This system
boost the throughput of transferred 4070 allows customers to seamlessly move from
plans by 10 to 20 percent without any RF S-parameter measurement and older operating systems to the new
program modifications. This reduces test optional RF matrix permit efficient platform whilst retaining existing test
times and saves you money. testing of RF structures in production code resulting in hassle free deployment.
Virtual Multiple Testhead Technology The 4083A supports an Agilent PNA for
offers dramatic throughput improvements 20 GHz S-parameter measurements.
All 4080 Series testers running SPECS
support both synchronous and In addition, an 8x10 RF matrix option
www.euroasiasemiconductor.com IC Industry Award Winners 2008
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