20
Test and
inspection
Made to measure AXI
Automated optical inspection (AOI) manufacturer, Omron, is launching a new European business manager for Omron’s AOI division, Chris Warren,
automated AXI system which combines two different types of CT algorithm to explained: “Although the system is only a concept at this stage, it will become a
deliver tact times of just 500ms per projection. The Omron VT-X system is reality in the near future. Obviously, the most effective system we can build is
currently at the concept stage and will provide tomosynthesis and 3D one that the market wants, which is why we asked Electronica visitors to review
tomography for the inspection of heel fillets and BGA wet-ability with the system’s capabilities.”
resolutions of seven, 10, 15, 20 and 25µm/pixel at angles of zero, 15, 30 and
45deg. inspection.omron.eu
Boundary scan supports
Traditional bed-of-nails testing
was out of the question as
dedicated ICT test points would
consume too much board real estate
femotcell production
and could introduce signal integrity
issues.
Founder and VP engineering at
Ubiquisys, Pete Keevill, said: “Our
Femtocell vendor, Ubiquisys, is using
test strategy therefore marries
Jtag Technologies' boundary-scan
functional testing of the board's RF,
test solutions for volume production
analogue and power components
of its ZoneGate product. By
with boundary-scan testing of the
developing systems for factory
digital components. However, only
testing, Jtag Technologies was able
two of the components on the
to relieve the burden of developing
board are boundary-scan devices,
structural PCB tests, helping
so they need to be able to
Ubiquisys address demand from
cluster test several non-boundary-
consumers for cost-effective 3G
scan devices.
coverage in the home.
“Jtag Technologies' 4 TAP
The ZoneGate product is a single
controller was particularly suitable
PCB product which architecturally
because the ZoneGate PCB has
splits into RF circuitry, baseband
two boundary-scan chains and we
processing, clock circuits and power
are able to test two boards at the
supplies. This mixed-signal design
same time.”
features about 1,000 nets, the
majority of which connect BGA-
packaged digital components. www.jtag.co.uk
Put it to the test
Aster Technologies has introduced a new test coverage analysis tool
powered by TestWay. It is designed to help users quantify and qualify test
coverage for a range of inspection and test equipment including AOI, AXI,
BST, FPT, ICT and MDA.
QuadView-TPQR allows users to compute the test coverage of a single
piece of test equipment. Board data can be imported directly from test
program generation applications created in Siemens-TestExpert or Mentor
Graphics CAMCAD. TPQR then checks the ability of each test to catch certain
defect types based on component type, value, tolerance, board connectivity,
component location, shape and pitch.
Alternatively, TestWay Express provides more sophisticated analysis
because it allows users to combine various types of inspection or test
equipment within a heterogeneous production line. Test coverage
qualification can be carried out for each test stage, but also consolidated for
the complete line. It also calculates the theoretical coverage of various test
strategies, prior to product development.
Finally, TestWay Express conducts post-development analysis by reading
the test programs from various testers and calculating the real coverage that is
achievable. Simulating various test combinations can reduce the number of
test strategy, but will also identify the shortfall for each specific test stage by
false calls, diagnostic inaccuracies and eliminate overlapping tests, resulting
analysing the number of defects detected at each stage in the test line.
in reduced overall test time.
TestWay Express not only identifies lack of coverage within a combined www.aster-ingenierie.com
November/December 2008 Electronics Assembly
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